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Messages - Michell58J

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Magnification is often treated as a secondary specification behind focal length or industrial cameras aperture, yet it is the parameter that most directly ties optical hardware to the actual inspection task.

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Office / SWIR Machine Vision Cameras for Silicon Wafer Inspection
« on: July 17, 2026, 02:51:03 AM »
For basic presence/absence or color-contrast defect detection, standard achromatic lenses are usually sufficient and machine vision systems apochromatic correction adds cost without proportional benefit.

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This machine vision systems scenario repeats itself across factories worldwide whenever throughput increases outpace the imaging configuration supporting them.

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Not always; telecentric optics are justified when measurement accuracy on features like vial diameter, fill height, or industrial vision systems seal width must hold to fine tolerances regardless of the object's exact position in the depth of field.

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